Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry: Fid-Bau Portal

Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Senthil, K. / Mangalaraj, D. / Narayandass, S. K. / Adachi, S.

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Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Senthil, K. / Mangalaraj, D. / Narayandass, S. K. / Adachi, S.

Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Senthil, K. / Mangalaraj, D. / Narayandass, S. K. / Adachi, S.

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Order at Subito €

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Document information

Title:

Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Contributors:

Senthil, K. (author) / Mangalaraj, D. (author) / Narayandass, S. K. (author) / Adachi, S. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 78 ; 53 - 58

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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