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The Use of Full-Profile Small-Angle Reflections in the X-Ray Diffraction Analysis of Polycrystals
The Use of Full-Profile Small-Angle Reflections in the X-Ray Diffraction Analysis of Polycrystals
The Use of Full-Profile Small-Angle Reflections in the X-Ray Diffraction Analysis of Polycrystals
Serykh, V. P. (author)
INDUSTRIAL LABORATORY C/C OF ZAVODSKAIA LABORATORIIA ; 66 ; 237-238
2000-01-01
2 pages
Article (Journal)
English
DDC:
607.2
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