Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen

    New search for: Yuqing, X.
    New search for: Liming, L.
    New search for: Weigang, L.
    New search for: Dequan, Y.
    New search for: Daoan, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen

    New search for: Yuqing, X.
    New search for: Liming, L.
    New search for: Weigang, L.
    New search for: Dequan, Y.
    New search for: Daoan, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen

    New search for: Yuqing, X.
    New search for: Liming, L.
    New search for: Weigang, L.
    New search for: Dequan, Y.
    New search for: Daoan, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen

    Contributors:

    Yuqing, X. (author) / Liming, L. (author) / Weigang, L. (author) / Dequan, Y. (author) / Daoan, D. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 79 ; 68 - 70

    Publication date:

    2001-01-01

    Size:

    3 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Atomic force microscopy study of thermal stability of silver selenide thin films grown on silicon

    Mohanty, B. C. / Murty, B. S. / Vijayan, V. et al. | British Library Online Contents | 2006

    Atomic force microscopy study of small-size nanotubular polymer thin films

    Zhu, C. F. / Lee, I. / Li, J. W. et al. | British Library Online Contents | 1999

    Atomic force microscopy study, kinetic roughening and multifractal analysis of electrodeposited silver films

    Nasehnejad, M. / Gholipour Shahraki, M. / Nabiyouni, G. | British Library Online Contents | 2016

    Atomic force microscopy study, kinetic roughening and multifractal analysis of electrodeposited silver films

    Nasehnejad, M. / Gholipour Shahraki, M. / Nabiyouni, G. | British Library Online Contents | 2016

    Atomic force microscopy study, kinetic roughening and multifractal analysis of electrodeposited silver films

    Nasehnejad, M. / Gholipour Shahraki, M. / Nabiyouni, G. | British Library Online Contents | 2016

    Back to top