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Force Modulation Atomic Force Microscopy as a Powerful Tool in Organic-Inorganic Hybrid Materials Analysis

Schiavon, G. / Kuchler, J. G. / Corain, B. / Hiller, W.

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Force Modulation Atomic Force Microscopy as a Powerful Tool in Organic-Inorganic Hybrid Materials Analysis

Schiavon, G. / Kuchler, J. G. / Corain, B. / Hiller, W.

Force Modulation Atomic Force Microscopy as a Powerful Tool in Organic-Inorganic Hybrid Materials Analysis

Schiavon, G. / Kuchler, J. G. / Corain, B. / Hiller, W.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Force Modulation Atomic Force Microscopy as a Powerful Tool in Organic-Inorganic Hybrid Materials Analysis

Contributors:

Schiavon, G. (author) / Kuchler, J. G. (author) / Corain, B. (author) / Hiller, W. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 13 ; 310-313

Publication date:

2001-01-01

Size:

4 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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