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First Prize Mechanical properties of thin films quantified via instrumented indentation

Van Vliet, K. J. / Gouldstone, A.

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First Prize Mechanical properties of thin films quantified via instrumented indentation

Van Vliet, K. J. / Gouldstone, A.

First Prize Mechanical properties of thin films quantified via instrumented indentation

Van Vliet, K. J. / Gouldstone, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

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Document information

Title:

First Prize Mechanical properties of thin films quantified via instrumented indentation

Contributors:

Van Vliet, K. J. (author) / Gouldstone, A. (author)

Published in:

SURFACE ENGINEERING -LONDON- ; 17 ; 140-146

Publication date:

2001-01-01

Size:

7 pages

ISSN:

0267-0844

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.44

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