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    Defect Studies in Semiconductors

    New search for: Fujinami, M.
    New search for: Sawada, T.
    New search for: Akahane, T.

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    Defect Studies in Semiconductors

    New search for: Fujinami, M.
    New search for: Sawada, T.
    New search for: Akahane, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defect Studies in Semiconductors

    New search for: Fujinami, M.
    New search for: Sawada, T.
    New search for: Akahane, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Defect Studies in Semiconductors

    Contributors:

    Fujinami, M. (author) / Sawada, T. (author) / Akahane, T. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 363/365 ; 52-55

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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