Open-Volume Defects in Plastically Deformed Semiconductors: Fid-Bau Portal

Open-Volume Defects in Plastically Deformed Semiconductors

Leipner, H. S. / Hubner, C. G. / Staab, T. E. M. / Krause-Rehberg, R.

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Open-Volume Defects in Plastically Deformed Semiconductors

Leipner, H. S. / Hubner, C. G. / Staab, T. E. M. / Krause-Rehberg, R.

Open-Volume Defects in Plastically Deformed Semiconductors

Leipner, H. S. / Hubner, C. G. / Staab, T. E. M. / Krause-Rehberg, R.

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Check availability in my library

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Document information

Title:

Open-Volume Defects in Plastically Deformed Semiconductors

Contributors:

Leipner, H. S. (author) / Hubner, C. G. (author) / Staab, T. E. M. (author) / Krause-Rehberg, R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 363/365 ; 61-63

Publication date:

2001-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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