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Nondestructive testing of ceramic capacitors by partial discharge method
Nondestructive testing of ceramic capacitors by partial discharge method
Nondestructive testing of ceramic capacitors by partial discharge method
Shin, B. C. (author) / Kim, S. C. (author) / Nahm, C. W. (author) / Jang, S. J. (author)
MATERIALS LETTERS ; 50 ; 82-86
2001-01-01
5 pages
Article (Journal)
English
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