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    Simulation of fatigue micro crack growth Part 1: Modelling and results of simulation, micro crack growth, scatter, effect of load condition, density of micro crack seeds and grain size

    New search for: Zenner, H.
    New search for: Potter, K.
    New search for: Schramm, A.
    New search for: Suhartono, H. A.

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    Simulation of fatigue micro crack growth Part 1: Modelling and results of simulation, micro crack growth, scatter, effect of load condition, density of micro crack seeds and grain size

    New search for: Zenner, H.
    New search for: Potter, K.
    New search for: Schramm, A.
    New search for: Suhartono, H. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Simulation of fatigue micro crack growth Part 1: Modelling and results of simulation, micro crack growth, scatter, effect of load condition, density of micro crack seeds and grain size

    New search for: Zenner, H.
    New search for: Potter, K.
    New search for: Schramm, A.
    New search for: Suhartono, H. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Simulation of fatigue micro crack growth Part 1: Modelling and results of simulation, micro crack growth, scatter, effect of load condition, density of micro crack seeds and grain size

    Contributors:

    Zenner, H. (author) / Potter, K. (author) / Schramm, A. (author) / Suhartono, H. A. (author)

    Published in:

    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK ; 32 ; 845-857

    Publication date:

    2001-01-01

    Size:

    13 pages

    ISSN:

    0933-5137

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    German

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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