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Determination of the Yield Properties of Thin Films Using Enhanced Coherent Gradient Sensing

Singh, R. P. / Rosakis, A. J.

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Determination of the Yield Properties of Thin Films Using Enhanced Coherent Gradient Sensing

Singh, R. P. / Rosakis, A. J.

Determination of the Yield Properties of Thin Films Using Enhanced Coherent Gradient Sensing

Singh, R. P. / Rosakis, A. J.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Determination of the Yield Properties of Thin Films Using Enhanced Coherent Gradient Sensing

Contributors:

Singh, R. P. (author) / Rosakis, A. J. (author)

Published in:

EXPERIMENTAL MECHANICS ; 41 ; 403-411

Publication date:

2001-01-01

Size:

9 pages

ISSN:

0014-4851

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1

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