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    Atomic force microscopy and the mechanism of fatigue crack growth

    New search for: Jono, M.
    New search for: Sugeta, A.
    New search for: Uematsu, Y.

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    Atomic force microscopy and the mechanism of fatigue crack growth

    New search for: Jono, M.
    New search for: Sugeta, A.
    New search for: Uematsu, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomic force microscopy and the mechanism of fatigue crack growth

    New search for: Jono, M.
    New search for: Sugeta, A.
    New search for: Uematsu, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Atomic force microscopy and the mechanism of fatigue crack growth

    Contributors:

    Jono, M. (author) / Sugeta, A. (author) / Uematsu, Y. (author)

    Published in:

    FATIGUE AND FRACTURE OF ENGINEERING MATERIALS AND STRUCTURES ; 24 ; 831-842

    Publication date:

    2001-01-01

    Size:

    12 pages

    ISSN:

    8756-758X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1123

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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