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Characterization of thermally activated dislocation mechanisms using transient tests

Martin, J. L. / Lo Piccolo, B. / Kruml, T. / Bonneville, J.

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Characterization of thermally activated dislocation mechanisms using transient tests

Martin, J. L. / Lo Piccolo, B. / Kruml, T. / Bonneville, J.

Characterization of thermally activated dislocation mechanisms using transient tests

Martin, J. L. / Lo Piccolo, B. / Kruml, T. / Bonneville, J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization of thermally activated dislocation mechanisms using transient tests

Contributors:

Martin, J. L. (author) / Lo Piccolo, B. (author) / Kruml, T. (author) / Bonneville, J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A -LAUSANNE- ; 322 ; 118 - 125

Publication date:

2002-01-01

Size:

8 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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