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Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds

Labossiere, P. E. / Dunn, M. L. / Cunningham, S. J.

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Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds

Labossiere, P. E. / Dunn, M. L. / Cunningham, S. J.

Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds

Labossiere, P. E. / Dunn, M. L. / Cunningham, S. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds

Contributors:

Labossiere, P. E. (author) / Dunn, M. L. (author) / Cunningham, S. J. (author)

Published in:

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS ; 50 ; 405-433

Publication date:

2002-01-01

Size:

29 pages

ISSN:

0022-5096

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530 / 620

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