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Characterization of structural, electrical and optical properties of rare-earth doped Si-based light emitting diodes
Characterization of structural, electrical and optical properties of rare-earth doped Si-based light emitting diodes
Characterization of structural, electrical and optical properties of rare-earth doped Si-based light emitting diodes
Sobolev, N. A. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 189 - 191
2002-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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