Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers: Fid-Bau Portal

Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers

Hatayama, T. / Kawahito, K. / Kijima, H. / Uraoka, Y. / Fuyuki, T.

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Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers

Hatayama, T. / Kawahito, K. / Kijima, H. / Uraoka, Y. / Fuyuki, T.

Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers

Hatayama, T. / Kawahito, K. / Kijima, H. / Uraoka, Y. / Fuyuki, T.

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Access via TIB

Check availability in my library

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Document information

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Document information

Title:

Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers

Contributors:

Hatayama, T. (author) / Kawahito, K. (author) / Kijima, H. (author) / Uraoka, Y. (author) / Fuyuki, T. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 925-928

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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