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    Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

    New search for: Zhao, L.
    New search for: Kop, T. A.
    New search for: Rolin, V.
    New search for: Sietsma, J.
    New search for: Mertens, A.
    New search for: Jacques, P. J.
    New search for: Van Der Zwaag, S.

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    Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

    New search for: Zhao, L.
    New search for: Kop, T. A.
    New search for: Rolin, V.
    New search for: Sietsma, J.
    New search for: Mertens, A.
    New search for: Jacques, P. J.
    New search for: Van Der Zwaag, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

    New search for: Zhao, L.
    New search for: Kop, T. A.
    New search for: Rolin, V.
    New search for: Sietsma, J.
    New search for: Mertens, A.
    New search for: Jacques, P. J.
    New search for: Van Der Zwaag, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Quantitative dilatometric analysis of intercritical annealing in a low-silicon TRIP steel

    Contributors:

    Zhao, L. (author) / Kop, T. A. (author) / Rolin, V. (author) / Sietsma, J. (author) / Mertens, A. (author) / Jacques, P. J. (author) / Van Der Zwaag, S. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 37 ; 1585-1591

    Publication date:

    2002-01-01

    Size:

    7 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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