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    Investigation of spatial distribution of defects in ultra-fine grained copper

    New search for: Czek, J.
    New search for: Prochazka, I.
    New search for: Melikhova, O.
    New search for: Brauer, G.
    New search for: Anwand, W.
    New search for: Kuzel, R.
    New search for: Cieslar, M.
    New search for: Islamgaliev, R. K.

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    Investigation of spatial distribution of defects in ultra-fine grained copper

    New search for: Czek, J.
    New search for: Prochazka, I.
    New search for: Melikhova, O.
    New search for: Brauer, G.
    New search for: Anwand, W.
    New search for: Kuzel, R.
    New search for: Cieslar, M.
    New search for: Islamgaliev, R. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of spatial distribution of defects in ultra-fine grained copper

    New search for: Czek, J.
    New search for: Prochazka, I.
    New search for: Melikhova, O.
    New search for: Brauer, G.
    New search for: Anwand, W.
    New search for: Kuzel, R.
    New search for: Cieslar, M.
    New search for: Islamgaliev, R. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation of spatial distribution of defects in ultra-fine grained copper

    Contributors:

    Czek, J. (author) / Prochazka, I. (author) / Melikhova, O. (author) / Brauer, G. (author) / Anwand, W. (author) / Kuzel, R. (author) / Cieslar, M. (author) / Islamgaliev, R. K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 194 ; 140-144

    Publication date:

    2002-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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