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    Quantitative Texture Analysis with Hard (100 keV) Synchrotron X-Rays

    New search for: Wcislak, L.
    New search for: Klein, H.
    New search for: Bunge, H. J.
    New search for: Garbe, U.
    New search for: Schneider, J. R.
    New search for: Lee, D. N.

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    Quantitative Texture Analysis with Hard (100 keV) Synchrotron X-Rays

    New search for: Wcislak, L.
    New search for: Klein, H.
    New search for: Bunge, H. J.
    New search for: Garbe, U.
    New search for: Schneider, J. R.
    New search for: Lee, D. N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative Texture Analysis with Hard (100 keV) Synchrotron X-Rays

    New search for: Wcislak, L.
    New search for: Klein, H.
    New search for: Bunge, H. J.
    New search for: Garbe, U.
    New search for: Schneider, J. R.
    New search for: Lee, D. N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Quantitative Texture Analysis with Hard (100 keV) Synchrotron X-Rays

    Contributors:

    Wcislak, L. (author) / Klein, H. (author) / Bunge, H. J. (author) / Garbe, U. (author) / Schneider, J. R. (author) / Lee, D. N.

    Published in:

    Textures of Materials ICOTOM 13 Part 1 ; 167-172

    MATERIALS SCIENCE FORUM ; 408/412

    Publication date:

    2002-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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