Effects of in situ thermal annealing on the transmission intensity and electrical properties in Hg0.8Cd0.2Te epilayers grown on CdTe buffer layers: Fid-Bau Portal

Effects of in situ thermal annealing on the transmission intensity and electrical properties in Hg0.8Cd0.2Te epilayers grown on CdTe buffer layers

Ryu, Y. S. / Song, B. S. / Kang, T. W. / Kim, H. J. / Kim, T. W.

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Effects of in situ thermal annealing on the transmission intensity and electrical properties in Hg0.8Cd0.2Te epilayers grown on CdTe buffer layers

Ryu, Y. S. / Song, B. S. / Kang, T. W. / Kim, H. J. / Kim, T. W.

Effects of in situ thermal annealing on the transmission intensity and electrical properties in Hg0.8Cd0.2Te epilayers grown on CdTe buffer layers

Ryu, Y. S. / Song, B. S. / Kang, T. W. / Kim, H. J. / Kim, T. W.

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Document information

Title:

Effects of in situ thermal annealing on the transmission intensity and electrical properties in Hg0.8Cd0.2Te epilayers grown on CdTe buffer layers

Contributors:

Ryu, Y. S. (author) / Song, B. S. (author) / Kang, T. W. (author) / Kim, H. J. (author) / Kim, T. W. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 21 ; 1497 - 1499

Publication date:

2002-01-01

Size:

3 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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Surface morphology of Hg0.8Cd0.2Te epilayers grown by LPE using horizontal slider

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Dependence of the microstructural and the electrical properties on the annealing temperature and Hg-cell fluxes for in situ annealed Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers

Ryu, Y. S. / Kang, T. W. / Kim, T. W. | British Library Online Contents | 2005

Effects of passivation treatment on the surface stability in indium-doped Hg0.8Cd0.2Te epilayers grown on p-Cd0.96Zn0.04Te substrates

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