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Determination of Nanometer-Scale Sizes in n^+-Type Porous Silicon by the Use of X-Ray and Raman Spectroscopies
Determination of Nanometer-Scale Sizes in n^+-Type Porous Silicon by the Use of X-Ray and Raman Spectroscopies
Determination of Nanometer-Scale Sizes in n^+-Type Porous Silicon by the Use of X-Ray and Raman Spectroscopies
Ramirez-Porras, A. (author)
SURFACE REVIEW AND LETTERS ; 9 ; 1769-1772
2002-01-01
4 pages
Article (Journal)
English
DDC:
530.417
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