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Measurement of the actual properties of matrix in the SiCw/6061Al composite by X-ray diffraction
Measurement of the actual properties of matrix in the SiCw/6061Al composite by X-ray diffraction
Measurement of the actual properties of matrix in the SiCw/6061Al composite by X-ray diffraction
Jiang, C. H. (author) / Wu, J. S. (author)
MATERIALS LETTERS ; 56 ; 1003-1006
2002-01-01
4 pages
Article (Journal)
English
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