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Study on the surface chemical properties of UV excimer laser irradiated polyamide by XPS, ToF-SIMS and CFM
Study on the surface chemical properties of UV excimer laser irradiated polyamide by XPS, ToF-SIMS and CFM
Study on the surface chemical properties of UV excimer laser irradiated polyamide by XPS, ToF-SIMS and CFM
Yip, J. (author) / Chan, K. (author) / Sin, K. M. (author) / Lau, K. S. (author)
APPLIED SURFACE SCIENCE ; 205 ; 151-159
2003-01-01
9 pages
Article (Journal)
English
DDC:
621.35
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