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    Direct Surface Force Measurement of Particles from Micron to Nanosize

    New search for: Cho, J.-M.
    New search for: Lee, S.-W.
    New search for: Sigmund, W. M.
    New search for: Komeya, K.
    New search for: Mitomo, M.
    New search for: Cheng, Y.-B.

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    Direct Surface Force Measurement of Particles from Micron to Nanosize

    New search for: Cho, J.-M.
    New search for: Lee, S.-W.
    New search for: Sigmund, W. M.
    New search for: Komeya, K.
    New search for: Mitomo, M.
    New search for: Cheng, Y.-B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Direct Surface Force Measurement of Particles from Micron to Nanosize

    New search for: Cho, J.-M.
    New search for: Lee, S.-W.
    New search for: Sigmund, W. M.
    New search for: Komeya, K.
    New search for: Mitomo, M.
    New search for: Cheng, Y.-B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Direct Surface Force Measurement of Particles from Micron to Nanosize

    Contributors:

    Cho, J.-M. (author) / Lee, S.-W. (author) / Sigmund, W. M. (author) / Komeya, K. / Mitomo, M. / Cheng, Y.-B.

    Published in:

    SiAlONs Proceedings of the International Symposium on SiAlONs, Tomiura Royal Hotel, December 2-4, 2001, Chiba, Japan ; 185-192

    KEY ENGINEERING MATERIALS

    Publication date:

    2003-01-01

    Size:

    8 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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