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    Hole trapping in self-assembled SiGe quantum nanostructures

    New search for: Volpi, F.
    New search for: Peaker, A. R.
    New search for: Hawkins, I. D.
    New search for: Halsall, M. P.
    New search for: Kenway, P. B.
    New search for: Portavoce, A.
    New search for: Ronda, A.
    New search for: Berbezier, I.

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    Hole trapping in self-assembled SiGe quantum nanostructures

    New search for: Volpi, F.
    New search for: Peaker, A. R.
    New search for: Hawkins, I. D.
    New search for: Halsall, M. P.
    New search for: Kenway, P. B.
    New search for: Portavoce, A.
    New search for: Ronda, A.
    New search for: Berbezier, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Hole trapping in self-assembled SiGe quantum nanostructures

    New search for: Volpi, F.
    New search for: Peaker, A. R.
    New search for: Hawkins, I. D.
    New search for: Halsall, M. P.
    New search for: Kenway, P. B.
    New search for: Portavoce, A.
    New search for: Ronda, A.
    New search for: Berbezier, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Hole trapping in self-assembled SiGe quantum nanostructures

    Contributors:

    Volpi, F. (author) / Peaker, A. R. (author) / Hawkins, I. D. (author) / Halsall, M. P. (author) / Kenway, P. B. (author) / Portavoce, A. (author) / Ronda, A. (author) / Berbezier, I. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 101 ; 338-344

    Publication date:

    2003-01-01

    Size:

    7 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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