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Positron Annihilation Studies of Defects at the SiO~2/SiC Interface

Dekker, J. / Saarinen, K. / Olafsson, H. O. / Sveinbjornsson, E. O.

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Positron Annihilation Studies of Defects at the SiO~2/SiC Interface

Dekker, J. / Saarinen, K. / Olafsson, H. O. / Sveinbjornsson, E. O.

Positron Annihilation Studies of Defects at the SiO~2/SiC Interface

Dekker, J. / Saarinen, K. / Olafsson, H. O. / Sveinbjornsson, E. O.

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Access via TIB

Check availability in my library

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Document information

Title:

Positron Annihilation Studies of Defects at the SiO~2/SiC Interface

Contributors:

Dekker, J. (author) / Saarinen, K. (author) / Olafsson, H. O. (author) / Sveinbjornsson, E. O. (author) / Bergman, P. / Janzen, E.

Published in:

Silicon Carbide and Related Materials 2002 ; 543-546

MATERIALS SCIENCE FORUM ; 433/436

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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