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    Characterization of vertical RESURF diodes using scanning probe microscopy

    New search for: Duhayon, N.
    New search for: Xu, M.
    New search for: Vandervorst, W.
    New search for: Hellemans, L.
    New search for: Rochefort, C.
    New search for: Van Dalen, R.

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    Characterization of vertical RESURF diodes using scanning probe microscopy

    New search for: Duhayon, N.
    New search for: Xu, M.
    New search for: Vandervorst, W.
    New search for: Hellemans, L.
    New search for: Rochefort, C.
    New search for: Van Dalen, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of vertical RESURF diodes using scanning probe microscopy

    New search for: Duhayon, N.
    New search for: Xu, M.
    New search for: Vandervorst, W.
    New search for: Hellemans, L.
    New search for: Rochefort, C.
    New search for: Van Dalen, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of vertical RESURF diodes using scanning probe microscopy

    Contributors:

    Duhayon, N. (author) / Xu, M. (author) / Vandervorst, W. (author) / Hellemans, L. (author) / Rochefort, C. (author) / Van Dalen, R. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 143-147

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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