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Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction

Lhotka, J. / el, R. K. / Cappuccio, G. / Valvoda, V.

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Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction

Lhotka, J. / el, R. K. / Cappuccio, G. / Valvoda, V.

Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction

Lhotka, J. / el, R. K. / Cappuccio, G. / Valvoda, V.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction

Contributors:

Lhotka, J. (author) / el, R. K. (author) / Cappuccio, G. (author) / Valvoda, V. (author)

Published in:

MATERIALS SCIENCE FORUM ; 443/444 ; 115-118

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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