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    Study on Grown-in Defects in CZ-Si by Positron Annihilation

    New search for: Nakagawa, S.
    New search for: Hori, F.
    New search for: Oshima, R.

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    Study on Grown-in Defects in CZ-Si by Positron Annihilation

    New search for: Nakagawa, S.
    New search for: Hori, F.
    New search for: Oshima, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study on Grown-in Defects in CZ-Si by Positron Annihilation

    New search for: Nakagawa, S.
    New search for: Hori, F.
    New search for: Oshima, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Study on Grown-in Defects in CZ-Si by Positron Annihilation

    Contributors:

    Nakagawa, S. (author) / Hori, F. (author) / Oshima, R. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 445/446 ; 159-161

    Publication date:

    2004-01-01

    Size:

    3 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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