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Reliability properties of SiGe HBTs
Reliability properties of SiGe HBTs
Reliability properties of SiGe HBTs
Rennane, A. (author) / Bary, L. (author) / Roux, J. L. (author) / Kuchenbecker, J. (author) / Graffeuil, J. (author) / Plana, R. (author)
APPLIED SURFACE SCIENCE ; 224 ; 341-346
2004-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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