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    Tailored microstructure of zirconia and hafnia-based thermal barrier coatings with low thermal conductivity and high hemispherical reflectance by EB-PVD

    New search for: Singh, J.
    New search for: Wolfe, D. E.
    New search for: Miller, R. A.
    New search for: Eldridge, J. I.
    New search for: Zhu, D. M.

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    Tailored microstructure of zirconia and hafnia-based thermal barrier coatings with low thermal conductivity and high hemispherical reflectance by EB-PVD

    New search for: Singh, J.
    New search for: Wolfe, D. E.
    New search for: Miller, R. A.
    New search for: Eldridge, J. I.
    New search for: Zhu, D. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Tailored microstructure of zirconia and hafnia-based thermal barrier coatings with low thermal conductivity and high hemispherical reflectance by EB-PVD

    New search for: Singh, J.
    New search for: Wolfe, D. E.
    New search for: Miller, R. A.
    New search for: Eldridge, J. I.
    New search for: Zhu, D. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Tailored microstructure of zirconia and hafnia-based thermal barrier coatings with low thermal conductivity and high hemispherical reflectance by EB-PVD

    Contributors:

    Singh, J. (author) / Wolfe, D. E. (author) / Miller, R. A. (author) / Eldridge, J. I. (author) / Zhu, D. M. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 39 ; 1975-1985

    Publication date:

    2004-01-01

    Size:

    11 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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