Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films: Fid-Bau Portal

Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films

Miura, Y. / Doi, M. / Moritani, T. / Takagi, M. / Imura, T. / Masuo, Y.

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Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films

Miura, Y. / Doi, M. / Moritani, T. / Takagi, M. / Imura, T. / Masuo, Y.

Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films

Miura, Y. / Doi, M. / Moritani, T. / Takagi, M. / Imura, T. / Masuo, Y.

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Document information

Title:

Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films

Contributors:

Miura, Y. (author) / Doi, M. (author) / Moritani, T. (author) / Takagi, M. (author) / Imura, T. (author) / Masuo, Y. (author) / Kang, S.-G. / Kobayashi, T.

Published in:

Designing, Processing and Properties of Advanced Engineering Materials PART 1 ; 445-448

MATERIALS SCIENCE FORUM ; 449/452

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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