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    Strain determination around Vickers indentation on silicon surface by Raman spectroscopy

    New search for: Puech, P.
    New search for: Demangeot, F.
    New search for: Pizani, P. S.

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    Strain determination around Vickers indentation on silicon surface by Raman spectroscopy

    New search for: Puech, P.
    New search for: Demangeot, F.
    New search for: Pizani, P. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Strain determination around Vickers indentation on silicon surface by Raman spectroscopy

    New search for: Puech, P.
    New search for: Demangeot, F.
    New search for: Pizani, P. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Strain determination around Vickers indentation on silicon surface by Raman spectroscopy

    Contributors:

    Puech, P. (author) / Demangeot, F. (author) / Pizani, P. S. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 19 ; 1273-1280

    Publication date:

    2004-01-01

    Size:

    8 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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