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    Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

    New search for: Muller, F.
    New search for: Muller, A. D.
    New search for: Schulze, S.
    New search for: Hietschold, M.

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    Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

    New search for: Muller, F.
    New search for: Muller, A. D.
    New search for: Schulze, S.
    New search for: Hietschold, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

    New search for: Muller, F.
    New search for: Muller, A. D.
    New search for: Schulze, S.
    New search for: Hietschold, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

    Contributors:

    Muller, F. (author) / Muller, A. D. (author) / Schulze, S. (author) / Hietschold, M. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 39 ; 3199-3200

    Publication date:

    2004-01-01

    Size:

    2 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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