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Development of Flaw Evaluation System for Creep-Fatigue Crack Propagation of High-Temperature
Development of Flaw Evaluation System for Creep-Fatigue Crack Propagation of High-Temperature
Development of Flaw Evaluation System for Creep-Fatigue Crack Propagation of High-Temperature
Fujishita, K. (author) / Miura, N. (author) / Takahashi, Y. (author) / Nakayama, Y. (author) / Kishimoto, K. / Kikuchi, M. / Shoji, T. / Saka, M.
2004-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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