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Characterization of Silicon Oxide Nanowires Directly Grown from NiO/Si

Park, B. / Yong, K.

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Characterization of Silicon Oxide Nanowires Directly Grown from NiO/Si

Park, B. / Yong, K.

Characterization of Silicon Oxide Nanowires Directly Grown from NiO/Si

Park, B. / Yong, K.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

Title:

Characterization of Silicon Oxide Nanowires Directly Grown from NiO/Si

Contributors:

Park, B. (author) / Yong, K. (author)

Published in:

SURFACE REVIEW AND LETTERS ; 11 ; 179-184

Publication date:

2004-01-01

Size:

6 pages

ISSN:

0218-625X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530.417

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