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Quantitative analysis on low cycle fatigue damage: a microstructural model for the prediction of fatigue life
Quantitative analysis on low cycle fatigue damage: a microstructural model for the prediction of fatigue life
Quantitative analysis on low cycle fatigue damage: a microstructural model for the prediction of fatigue life
Kim, H. J. (author) / Lee, C. S. (author) / Park, S. H. (author) / Shin, D. H. (author)
MATERIALS SCIENCE AND ENGINEERING A. ; 379 ; 210-217
2004-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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