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    Electronic characterization of alkali ruthenium hollandites: KRu4O8, RbRu4O8 and Cs0.8Li0.2Ru4O8

    New search for: Foo, M. L.
    New search for: Lee, W. L.
    New search for: Siegrist, T.
    New search for: Lawes, G.
    New search for: Ramirez, A. P.
    New search for: Ong, N. P.
    New search for: Cava, R. J.

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    Electronic characterization of alkali ruthenium hollandites: KRu4O8, RbRu4O8 and Cs0.8Li0.2Ru4O8

    New search for: Foo, M. L.
    New search for: Lee, W. L.
    New search for: Siegrist, T.
    New search for: Lawes, G.
    New search for: Ramirez, A. P.
    New search for: Ong, N. P.
    New search for: Cava, R. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electronic characterization of alkali ruthenium hollandites: KRu4O8, RbRu4O8 and Cs0.8Li0.2Ru4O8

    New search for: Foo, M. L.
    New search for: Lee, W. L.
    New search for: Siegrist, T.
    New search for: Lawes, G.
    New search for: Ramirez, A. P.
    New search for: Ong, N. P.
    New search for: Cava, R. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electronic characterization of alkali ruthenium hollandites: KRu4O8, RbRu4O8 and Cs0.8Li0.2Ru4O8

    Contributors:

    Foo, M. L. (author) / Lee, W. L. (author) / Siegrist, T. (author) / Lawes, G. (author) / Ramirez, A. P. (author) / Ong, N. P. (author) / Cava, R. J. (author)

    Published in:

    MATERIALS RESEARCH BULLETIN ; 39 ; 1663-1670

    Publication date:

    2004-01-01

    Size:

    8 pages

    ISSN:

    0025-5408

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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