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Characterization of crack-tip field and constraint for bending specimens under large-scale yielding
Characterization of crack-tip field and constraint for bending specimens under large-scale yielding
Characterization of crack-tip field and constraint for bending specimens under large-scale yielding
Chao, Y. J. (author) / Zhu, X. K. (author) / Kim, Y. (author) / Lar, P. S. (author) / Pechersky, M. J. (author) / Morgan, M. J. (author)
INTERNATIONAL JOURNAL OF FRACTURE ; 127 ; 283-302
2004-01-01
20 pages
Article (Journal)
English
DDC:
620.1126
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