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    Cyclic Oxidation Kinetics Modeling of NiAl Single Crystal

    New search for: Poquillon, D.
    New search for: Oquab, D.
    New search for: Monceau, D.
    New search for: Steinmetz, P.
    New search for: Wright, I. G.
    New search for: Meier, G.
    New search for: Galerie, A.
    New search for: Pieraggi, B.
    New search for: Podor, R.

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    Cyclic Oxidation Kinetics Modeling of NiAl Single Crystal

    New search for: Poquillon, D.
    New search for: Oquab, D.
    New search for: Monceau, D.
    New search for: Steinmetz, P.
    New search for: Wright, I. G.
    New search for: Meier, G.
    New search for: Galerie, A.
    New search for: Pieraggi, B.
    New search for: Podor, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Cyclic Oxidation Kinetics Modeling of NiAl Single Crystal

    New search for: Poquillon, D.
    New search for: Oquab, D.
    New search for: Monceau, D.
    New search for: Steinmetz, P.
    New search for: Wright, I. G.
    New search for: Meier, G.
    New search for: Galerie, A.
    New search for: Pieraggi, B.
    New search for: Podor, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Cyclic Oxidation Kinetics Modeling of NiAl Single Crystal

    Contributors:

    Poquillon, D. (author) / Oquab, D. (author) / Monceau, D. (author) / Steinmetz, P. / Wright, I. G. / Meier, G. / Galerie, A. / Pieraggi, B. / Podor, R.

    Published in:

    High Temperature Corrosion and Protection of Materials 6 PART 2 ; 737-746

    MATERIALS SCIENCE FORUM ; 461/464

    Publication date:

    2004-01-01

    Size:

    10 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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