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Characterization of Gallium-induced Intergranular Fracture Surface and the Auger Electron Spectroscopic Analysis for Mg Grain Boundary Segregation in AA6061 T4 Al-Mg-Si Alloy
Characterization of Gallium-induced Intergranular Fracture Surface and the Auger Electron Spectroscopic Analysis for Mg Grain Boundary Segregation in AA6061 T4 Al-Mg-Si Alloy
Characterization of Gallium-induced Intergranular Fracture Surface and the Auger Electron Spectroscopic Analysis for Mg Grain Boundary Segregation in AA6061 T4 Al-Mg-Si Alloy
Uan, J.-Y. (author) / Chang, C.-C. (author)
MATERIALS TRANSACTIONS ; 45 ; 1925-1932
2004-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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