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    Band line-up at the 4H-SiC/Ni interface determined with photoemission spectroscopy

    New search for: Beerbom, M. M.
    New search for: Bednarova, Z.
    New search for: Gargagliano, R.
    New search for: Emirov, Y. N.
    New search for: Schlaf, R.

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    Band line-up at the 4H-SiC/Ni interface determined with photoemission spectroscopy

    New search for: Beerbom, M. M.
    New search for: Bednarova, Z.
    New search for: Gargagliano, R.
    New search for: Emirov, Y. N.
    New search for: Schlaf, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Band line-up at the 4H-SiC/Ni interface determined with photoemission spectroscopy

    New search for: Beerbom, M. M.
    New search for: Bednarova, Z.
    New search for: Gargagliano, R.
    New search for: Emirov, Y. N.
    New search for: Schlaf, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
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    Document information
    Title:

    Band line-up at the 4H-SiC/Ni interface determined with photoemission spectroscopy

    Contributors:

    Beerbom, M. M. (author) / Bednarova, Z. (author) / Gargagliano, R. (author) / Emirov, Y. N. (author) / Schlaf, R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 236 ; 208-216

    Publication date:

    2004-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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