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Simultaneous characterization of bulk impurities and interface states by photocurrent measurements

Polignano, M. L. / Caricato, A. P.

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Simultaneous characterization of bulk impurities and interface states by photocurrent measurements

Polignano, M. L. / Caricato, A. P.

Simultaneous characterization of bulk impurities and interface states by photocurrent measurements

Polignano, M. L. / Caricato, A. P.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Simultaneous characterization of bulk impurities and interface states by photocurrent measurements

Contributors:

Polignano, M. L. (author) / Caricato, A. P. (author)

Published in:

APPLIED SURFACE SCIENCE ; 235 ; 340-350

Publication date:

2004-01-01

Size:

11 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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