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    Depth Profiling Analysis of Tarnish Films on Copper Formed During Short-Term Outdoor Exposure by Glow Discharge Optical Emission Spectroscopy

    New search for: Toyoda, E.
    New search for: Watanabe, M.
    New search for: Higashi, Y.
    New search for: Tanaka, T.
    New search for: Miyata, Y.
    New search for: Ichino, T.

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    Depth Profiling Analysis of Tarnish Films on Copper Formed During Short-Term Outdoor Exposure by Glow Discharge Optical Emission Spectroscopy

    New search for: Toyoda, E.
    New search for: Watanabe, M.
    New search for: Higashi, Y.
    New search for: Tanaka, T.
    New search for: Miyata, Y.
    New search for: Ichino, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Depth Profiling Analysis of Tarnish Films on Copper Formed During Short-Term Outdoor Exposure by Glow Discharge Optical Emission Spectroscopy

    New search for: Toyoda, E.
    New search for: Watanabe, M.
    New search for: Higashi, Y.
    New search for: Tanaka, T.
    New search for: Miyata, Y.
    New search for: Ichino, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Depth Profiling Analysis of Tarnish Films on Copper Formed During Short-Term Outdoor Exposure by Glow Discharge Optical Emission Spectroscopy

    Contributors:

    Toyoda, E. (author) / Watanabe, M. (author) / Higashi, Y. (author) / Tanaka, T. (author) / Miyata, Y. (author) / Ichino, T. (author)

    Published in:

    CORROSION -HOUSTON TX- ; 60 ; 729-735

    Publication date:

    2004-01-01

    Size:

    7 pages

    ISSN:

    0010-9312

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11223

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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