Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Defect and Ripeness Inspection of Citrus Using NIR Transmission Spectrum

    New search for: Kim, G.
    New search for: Lee, K.
    New search for: Choi, K.
    New search for: Son, J.
    New search for: Choi, D.
    New search for: Kang, S.
    New search for: Lee, S.-S.
    New search for: Yoon, D.-J.
    New search for: Lee, J.-H.
    New search for: Lee, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Defect and Ripeness Inspection of Citrus Using NIR Transmission Spectrum

    New search for: Kim, G.
    New search for: Lee, K.
    New search for: Choi, K.
    New search for: Son, J.
    New search for: Choi, D.
    New search for: Kang, S.
    New search for: Lee, S.-S.
    New search for: Yoon, D.-J.
    New search for: Lee, J.-H.
    New search for: Lee, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defect and Ripeness Inspection of Citrus Using NIR Transmission Spectrum

    New search for: Kim, G.
    New search for: Lee, K.
    New search for: Choi, K.
    New search for: Son, J.
    New search for: Choi, D.
    New search for: Kang, S.
    New search for: Lee, S.-S.
    New search for: Yoon, D.-J.
    New search for: Lee, J.-H.
    New search for: Lee, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Defect and Ripeness Inspection of Citrus Using NIR Transmission Spectrum

    Contributors:

    Kim, G. (author) / Lee, K. (author) / Choi, K. (author) / Son, J. (author) / Choi, D. (author) / Kang, S. (author) / Lee, S.-S. / Yoon, D.-J. / Lee, J.-H. / Lee, S.

    Published in:

    Advances in Nondestructive Evaluation Part 2 Proceedings of the 11^t^h Asian Pacific Conference on Nondestructive Testing, Jeju Island, Korea, 3-7 November 2003 ; 1008-1013

    KEY ENGINEERING MATERIALS

    Publication date:

    2004-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    To Act or Wait: A Two-Stage View of Ripeness

    Hancock, L. E. | British Library Online Contents | 2001

    CABLE DEFECT INSPECTION APPARATUS

    KIM YOUNG JOO / SEUNG HONG MIN | European Patent Office | 2021

    Free access

    CABLE DEFECT INSPECTION APPARATUS

    European Patent Office | 2021

    Free access

    Research of Histogram-Based Fruit Ripeness Identification with Nearest Neighbor Distance

    Ma, R.F. | British Library Online Contents | 2011

    Technical note: Feasibility of near infrared transmittance spectroscopy to predict cheese ripeness

    Currò, S. / Manuelian, C. L. / Penasa, M. et al. | BASE | 2017

    Free access
    Back to top