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Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

Kim, Y. J. / Lee, J. G. / Ahn, B. / Lee, S. S.

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Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

Kim, Y. J. / Lee, J. G. / Ahn, B. / Lee, S. S.

Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

Kim, Y. J. / Lee, J. G. / Ahn, B. / Lee, S. S.

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Document information

Title:

Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

Contributors:

Kim, Y. J. (author) / Lee, J. G. (author) / Ahn, B. (author) / Lee, S. S. (author) / Lee, S.-S. / Yoon, D.-J. / Lee, J.-H. / Lee, S.

Published in:

Advances in Nondestructive Evaluation Part 1 Proceedings of the 11^t^h Asian Pacific Conference on Nondestructive Testing, Jeju Island, Korea, 3-7 November 2003 ; 606-611

KEY ENGINEERING MATERIALS ; 270/273

Publication date:

2004-01-01

Size:

6 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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