Nondestructive and Destructive Characterization of Nano-Structured Multilayer

Kim, T. G. (author) / Lee, S. Y. (author) / Kang, I. Y. (author) / Chung, Y. C. (author) / Ahn, J. (author) / Lee, S.-S. / Yoon, D.-J. / Lee, J.-H. / Lee, S.

Advances in Nondestructive Evaluation Part 1 Proceedings of the 11^t^h Asian Pacific Conference on Nondestructive Testing, Jeju Island, Korea, 3-7 November 2003 ; 849-854

KEY ENGINEERING MATERIALS ; 270/273

2004-01-01

6 pages

1013-9826

Article (Journal)

Print

English

DDC:  620.11