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Structure of the Si(113) surface studied by surface X-ray diffraction

Mizuno, Y. / Akimoto, K. / Aoyama, T. / Suzuki, H. / Nakahara, H. / Ichimiya, A. / Sumitani, K. / Takahashi, T. / Zhang, X. / Sugiyama, H.

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Structure of the Si(113) surface studied by surface X-ray diffraction

Mizuno, Y. / Akimoto, K. / Aoyama, T. / Suzuki, H. / Nakahara, H. / Ichimiya, A. / Sumitani, K. / Takahashi, T. / Zhang, X. / Sugiyama, H.

Structure of the Si(113) surface studied by surface X-ray diffraction

Mizuno, Y. / Akimoto, K. / Aoyama, T. / Suzuki, H. / Nakahara, H. / Ichimiya, A. / Sumitani, K. / Takahashi, T. / Zhang, X. / Sugiyama, H.

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Document information

Title:

Structure of the Si(113) surface studied by surface X-ray diffraction

Contributors:

Mizuno, Y. (author) / Akimoto, K. (author) / Aoyama, T. (author) / Suzuki, H. (author) / Nakahara, H. (author) / Ichimiya, A. (author) / Sumitani, K. (author) / Takahashi, T. (author) / Zhang, X. (author) / Sugiyama, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 237 ; 40-44

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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