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    Study on the Effects of Substrate Grain Size on Diamond Thin Films Deposited on Tungsten Carbide Substrates

    New search for: Jian, X. G.
    New search for: Chen, M.
    New search for: Sun, F. H.
    New search for: Ma, Y. P.
    New search for: Zhang, Z. M.
    New search for: Shen, W. P.
    New search for: Xu, J. Q.

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    Study on the Effects of Substrate Grain Size on Diamond Thin Films Deposited on Tungsten Carbide Substrates

    New search for: Jian, X. G.
    New search for: Chen, M.
    New search for: Sun, F. H.
    New search for: Ma, Y. P.
    New search for: Zhang, Z. M.
    New search for: Shen, W. P.
    New search for: Xu, J. Q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study on the Effects of Substrate Grain Size on Diamond Thin Films Deposited on Tungsten Carbide Substrates

    New search for: Jian, X. G.
    New search for: Chen, M.
    New search for: Sun, F. H.
    New search for: Ma, Y. P.
    New search for: Zhang, Z. M.
    New search for: Shen, W. P.
    New search for: Xu, J. Q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Study on the Effects of Substrate Grain Size on Diamond Thin Films Deposited on Tungsten Carbide Substrates

    Contributors:

    Jian, X. G. (author) / Chen, M. (author) / Sun, F. H. (author) / Ma, Y. P. (author) / Zhang, Z. M. (author) / Shen, W. P. / Xu, J. Q.

    Published in:

    Advances in Engineering Plasticity and Its Applications ; 1137-1142

    KEY ENGINEERING MATERIALS ; 274/276

    Publication date:

    2004-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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