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    Optical characterization of b-FeSi2 layers formed by ion beam synthesis

    New search for: Ayache, R.
    New search for: Bouabellou, A.
    New search for: Richter, E.

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    Optical characterization of b-FeSi2 layers formed by ion beam synthesis

    New search for: Ayache, R.
    New search for: Bouabellou, A.
    New search for: Richter, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical characterization of b-FeSi2 layers formed by ion beam synthesis

    New search for: Ayache, R.
    New search for: Bouabellou, A.
    New search for: Richter, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Optical characterization of b-FeSi2 layers formed by ion beam synthesis

    Contributors:

    Ayache, R. (author) / Bouabellou, A. (author) / Richter, E. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 7 ; 463-466

    Publication date:

    2004-01-01

    Size:

    4 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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