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    A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates

    New search for: Florando, J. N.
    New search for: Nix, W. D.

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    A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates

    New search for: Florando, J. N.
    New search for: Nix, W. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates

    New search for: Florando, J. N.
    New search for: Nix, W. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates

    Contributors:

    Florando, J. N. (author) / Nix, W. D. (author)

    Published in:

    JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS ; 53 ; 619-638

    Publication date:

    2005-01-01

    Size:

    20 pages

    ISSN:

    0022-5096

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  530 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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